Measurement Devices Setup
Measurement Devices
The following measurement devices are supported by Apogee Prepress:
Measurement Device | Measurement Conditions |
|---|
Barbieri Spectro LFP | M0 |
Barbieri Spectro LFP qb | M0, M1, M2, M3 |
Barbieri SpectroPad | M0, M1, M2 |
X-Rite i1 (UV cut) | M0 (M2) |
X-Rite i1 Pro II | M0, M1, M2 |
X-Rite i1 IO Pro | M0 |
X-Rite i1 IO Pro II | M0, M1, M2 |
X-Rite i1 Pro III | M0, M1, M2, M3 |
X-Rite i1 Pro III Plus | M0, M1, M2, M3 |
X-Rite i1 IO Pro III | M0, M1, M2, M3 |
X-Rite i1 IO Pro III Plus | M0, M1, M2, M3 |
X-Rite i1 iSis Pro | M0, M2 |
X-Rite i1 iSis Pro II | M0, M1, M2 |
X-Rite eXact scan | M0, M1, M2 |
X-Rite eXact 2 scan | M0, M1, M2 |
SpectroProofer ILS20 | M0 |
SpectroProofer ILS30 | M0, M1, M2 |
Konica Minolta FD-5 | M0, M1, M2 |
Konica Minolta FD-7/FD-5BT2 | M0, M1, M2 |
Konica Minolta FD-9 (old model name of Myiro 9) | M0, M1, M2 |
Myiro 1 | M0, M1, M2 |
Myiro 9 | M0, M1, M2 |
Techkon SpectroDens | M0, M1, M2 |
Measurement Conditions
Measurement methodology defined in ISO 13655 to address fluorescence effects, makes it easier to exchange data between devices and standardize measurements. Measurement devices must apply to this standard. Controlling the measurement conditions is the only way to meet the standard. This is accomplished by implementing the XRGA standard and standardizing the measurement routines. Devices that support the XRGA (X-Rite developed) standard simplifies the exchange of color data.
The following Measurement Illuminant modes (measurement conditions) are used to classify this measurement methodology:
•Mode M0
•The current measurement condition: no adaptation or unknown. The measurement mode does not change anything to the spectral data. The M0 is the most used practice today of all Apogee-supported measurement devices.
•Only to be used in "old" applications for substrates without any OBA.
•Mode M1
•The M1 measurement illuminant condition is defined to reduce differences in measurements between devices due to fluorescence effects (substrates or even inks). Standards will incorporate the M1 conditions in updated versions of standards.
•The go to for all measurements.
•Mode M2
•Measurements with the M2 factor are the measurements with a UV-cut filter. These measurements are different, since they use a standardized theoretical UV filter which influences the complete spectral range.
•Old devices with UV-cut filter will be labeled as fixed M2.
•Only to be used in "old" application with substrates full of OBAs.
•Mode M3
•Measurements with the M3 factor elaborate further on the M2 factor. It incorporates a polarization factor allowing to exclude the unwanted effect of highly diffused reflections.
•Sometimes used for "wet" measurements such as inline systems of offset presses.